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Re: [802.3_50G] review of baveja_3cd_01_1117

Thank you for the review.


The trouble is that the data point looks as an outlier as the data is sparse. Doing the measurement on 10 devices was significantly time consuming. That device happened to have best RX sensitivity. Upon further review of chip level data, that device is part of normal distribution but has lower bandwidth than its peers.


The feedback I have is


1)      Measure more devices,  lets call it 20, reflecting normal wafer level distribution, this will allow more data loading on low bandwidth side  

2)      Turn on the TDECQ optimizer 

3)       Measure with and without time center optimization.

4)      Rereport the correlation or lack of thereof at next ad-hoc



Thanks and BR,

Prashant P Baveja, Ph.D

Deputy Manager, R&D


Applied Optoelectronics, Inc. (NASDAQ: AAOI)

13139 Jess Pirtle Blvd
Sugar Land, TX 77478


+1-281-295-1800 Ext. 287
+1-281-295-1888 (fax) 


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From: Jonathan King [mailto:jonathan.king@xxxxxxxxxxx]
Sent: Tuesday, November 07, 2017 1:30 PM
To: STDS-802-3-50G@xxxxxxxxxxxxxxxxx
Subject: [802.3_50G] review of baveja_3cd_01_1117