|Thread Links||Date Links|
|Thread Prev||Thread Next||Thread Index||Date Prev||Date Next||Date Index|
While discussing last week’s call with Ali, I realized one area that had gotten inadvertently cut from my list for discussion was the use of test cards for a chip-to-module test specification. Given that we are leveraging off of this concept significantly in IEEE P802.3ba, I believe that the group would also want to see the use of test cards specified for any future work in a higher speed chip-to-module interface.
I intend to work this into my draft of a proposed response.
As a reminder, the ad hoc will hold a phone conference on Tuesday, Nov 10 at10am EST. Details may be found at http://www.ieee802.org/3/ba/public/AdHoc/OIF28G/confcall.html.
Please take a moment to review the IEEE patent policy before the call. It may be found at http://www.ieee802.org/3/patent.html.