Thread Links | Date Links | ||||
---|---|---|---|---|---|
Thread Prev | Thread Next | Thread Index | Date Prev | Date Next | Date Index |
Dear colleagues,
In several places—such as clause 179.9.5.3.3 (Test channel calibration, CR) and annexes 176C (C2C) and 176D (C2M)—there is a recommendation to adjust the pattern generator jitter to approach practical limits (23mUI Jrms, 120muI J4u03) before
injecting broadband noise. Please see the screenshot below for reference. However, unlike the CK standard (see 120G.3.3.5.1 Host stressed input test setup), these clauses do not specify the jitter mix. My concern is that this could lead to receivers being tested with overly simplistic jitter profiles—e.g., using only sinusoidal jitter (SJ)—which may not reflect realistic stress conditions. For example, it is possible to approach the 23
mUI Jrms target using only 50 mUI SJ. Do you think we should clarify or tighten the guidance to ensure more representative jitter conditions? Looking forward to your thoughts. Best regards, Best regards, Dr. Hadrien Louchet, Keysight Technologies Deutschland GmbH, Herrenberger Straße 130, 71034 Böblingen
Sitz der Gesellschaft: Böblingen – Amtsgericht Stuttgart HRB 747687, WEEE-Reg.-Nr. DE 26672786 Geschäftsführer: Dr. Joachim Peerlings (Vorsitzender), Thomas Götzl
To unsubscribe from the STDS-802-3-B400G-ELEC list, click the following link: https://listserv.ieee.org/cgi-bin/wa?SUBED1=STDS-802-3-B400G-ELEC&A=1 |